complex index of refraction

基本解释

The complex index of refraction, complex dielectric constant and thickness of nanofilm at different wavelength were all measured by ellipsometer.
用橢圓偏振儀測試不同波長下的複折射率和複介電常數及納米膜的厚度；
In the study of radiation characteristics of particles, computing the particulate optical constants (the complex index of refraction) is a basic issue and occupies a key position.
在粒子輻射特性的研究中，粒子的光學常數即複折射率的求解問題佔有基礎性的關鍵地位。
Comparing with other ways to obtain the complex refraction index of infrared absorbing thin film, such as by elliptical polarization spectrometer, this method is effective and accurate.
實踐証明，較之其它計算複折射率的方法，如橢偏譜測量法，本方法是有傚和準確的。