scanning probe microscope

基本解释

Up to now the imported commercial scanning probe microscope(SPM) has not an automatic error correcting and reducing system.
目前，我国引进的一般商业性的SPM（扫描探针显微镜）中缺少误差的自动修正和改进系统。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜（SPM）的测量和定位精度，是纳米仪器界始终追求的目标。
The research of scanning probe microscope(SPM) commonly used platform provides a new idea and method for developing SPM instrument, makes SPM instrument more common, open and combinative.
SPM通用平台是一套扫描探针显微镜开发工具系统，它提供了一种开发生产SPM新的思路和方法，使SPM成为通用、开放、兼容的仪器体系。